%0 Conference Paper %1 conf/ets/EngelkePRB04 %A Engelke, Piet %A Polian, Ilia %A Renovell, Michel %A Becker, Bernd %B European Test Symposium %D 2004 %I IEEE Computer Society %K dblp %P 160-165 %T Automatic test pattern generation for resistive bridging faults. %U http://dblp.uni-trier.de/db/conf/ets/ets2004.html#EngelkePRB04 %@ 0-7695-2119-3

@inproceedings{conf/ets/EngelkePRB04, added-at = {2015-08-18T00:00:00.000+0200}, author = {Engelke, Piet and Polian, Ilia and Renovell, Michel and Becker, Bernd}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/291c7cd03f19777a59a1a727f872ba7ba/dblp}, booktitle = {European Test Symposium}, crossref = {conf/ets/2004}, ee = {http://doi.ieeecomputersociety.org/10.1109/ETSYM.2004.1347652}, interhash = {9c0149669b00c0ee3530434ab9ec13be}, intrahash = {91c7cd03f19777a59a1a727f872ba7ba}, isbn = {0-7695-2119-3}, keywords = {dblp}, pages = {160-165}, publisher = {IEEE Computer Society}, timestamp = {2016-02-02T15:20:12.000+0100}, title = {Automatic test pattern generation for resistive bridging faults.}, url = {http://dblp.uni-trier.de/db/conf/ets/ets2004.html#EngelkePRB04}, year = 2004 }