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Transparent Word-Oriented Memory BIST Based on Symmetric March Algorithms.

V. Yarmolik, I. Bykov, S. Hellebrand, and H. Wunderlich. EDCC, volume 1667 of Lecture Notes in Computer Science, page 339-350. Springer, (1999)

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Prof. Dr. Hans-Joachim Wunderlich University of Stuttgart

Univ. -Prof. Dr. Hans-Joachim Werner University of Stuttgart

A density-fitting implementation of the density-based basis-set correction methodA. Heßelmann, E. Giner, P. Reinhardt, P. Knowles, H. Werner, and J. Toulouse. Journal of computational chemistry, 45 (15): 1247-1253 (2024)

Hans-Joachim Bungartz

Hans-Joachim Bieg

Hans-Joachim Gehrmann University of Stuttgart

Other publications of authors with the same name

A Mixed-Mode BIST Scheme Based on Folding Compression.H. Liang, S. Hellebrand, and H. Wunderlich. J. Comput. Sci. Technol., 17 (2): 203-212 (2002)Using mission logic for embedded testing.R. Dorsch, and H. Wunderlich. DATE, page 805. IEEE Computer Society, (2001)Deterministic Pattern Generation for Weighted Random Pattern Testing.B. Reeb, and H. Wunderlich. ED&TC, page 30-36. IEEE Computer Society, (1996)Tools and devices supporting the pseudo-exhaustive test.S. Hellebrand, and H. Wunderlich. EURO-DAC, page 13-17. IEEE Computer Society, (1990)Reuse of Structural Volume Test Methods for In-System Testing of Automotive ASICs.A. Cook, D. Ull, M. Elm, H. Wunderlich, H. Randoll, and S. Dohren. Asian Test Symposium, page 214-219. IEEE Computer Society, (2012)Embedded Test for Highly Accurate Defect Localization.A. Mumtaz, M. Imhof, S. Holst, and H. Wunderlich. Asian Test Symposium, page 213-218. IEEE Computer Society, (2011)Accurate Multi-cycle ATPG in Presence of X-Values.D. Erb, M. Kochte, M. Sauer, H. Wunderlich, and B. Becker. Asian Test Symposium, page 245-250. IEEE Computer Society, (2013)Test pattern generation in presence of unknown values based on restricted symbolic logic.D. Erb, K. Scheibler, M. Kochte, M. Sauer, H. Wunderlich, and B. Becker. ITC, page 1-10. IEEE Computer Society, (2014)Efficient Pattern Mapping for Deterministic Logic BIST.V. Gherman, H. Wunderlich, H. Vranken, F. Hapke, M. Wittke, and M. Garbers. ITC, page 48-56. IEEE Computer Society, (2004)X-Masking During Logic BIST and Its Impact on Defect Coverage.Y. Tang, H. Wunderlich, H. Vranken, F. Hapke, M. Wittke, P. Engelke, I. Polian, and B. Becker. ITC, page 442-451. IEEE Computer Society, (2004)