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Accurate Multi-cycle ATPG in Presence of X-Values.

D. Erb, M. Kochte, M. Sauer, H. Wunderlich, and B. Becker. Asian Test Symposium, page 245-250. IEEE Computer Society, (2013)

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Dr. -Ing. Thomas Erb University of Stuttgart

Univ. -Prof. Dr. rer. nat. Dominik Göddeke University of Stuttgart

Robust and Efficient Preconditioners for Stokes-Darcy ProblemsP. Strohbeck, C. Riethmüller, D. Göddeke, and I. Rybak. Finite Volumes for Complex Applications X, volume 1 : Elliptic and Parabolic Problems of Springer Proceedings in Mathematics & Statistics, page 375-383. Cham, Springer, (2023)

Dominik Starzmann University of Stuttgart

Lessons Learned and First Results of the E-Band CubeSat EIVEM. Koller, L. Bötsch-Zavřel, M. Eggert, M. Fugmann, C. Holeczek, M. Kranz, M. Lengowski, T. Löffler, L. Loidold, P. Maier and 17 other author(s). Preprint, (2023)

Dominik Morar

Dominik Morar University of Stuttgart

Other publications of authors with the same name

Applying Tailored Formal Methods to X-ATPG.K. Scheibler, D. Erb, and B. Becker. MBMV, page 138. Albert-Ludwigs-Universität Freiburg, (2016)Accurate QBF-Based Test Pattern Generation in Presence of Unknown ValuesD. Erb, M. Kochte, S. Reimer, M. Sauer, H. Wunderlich, and B. Becker. IEEE transactions on computer-aided design of integrated circuits and systems, 34 (12): 2025-2038 (2015)Improving test pattern generation in presence of unknown values beyond restricted symbolic logic.K. Scheibler, D. Erb, and B. Becker. ETS, page 1-6. IEEE, (2015)Circuit Parameter Independent Test Pattern Generation for Interconnect Open Defects.D. Erb, K. Scheibler, M. Sauer, S. Reddy, and B. Becker. ATS, page 131-136. IEEE Computer Society, (2014)Accurate QBF-based test pattern generation in presence of unknown values.S. Hillebrecht, M. Kochte, D. Erb, H. Wunderlich, and B. Becker. DATE, page 436-441. EDA Consortium San Jose, CA, USA / ACM DL, (2013)Efficient SMT-based ATPG for interconnect open defects.D. Erb, K. Scheibler, M. Sauer, and B. Becker. DATE, page 1-6. European Design and Automation Association, (2014)Accurate CEGAR-based ATPG in presence of unknown values for large industrial designs.K. Scheibler, D. Erb, and B. Becker. DATE, page 972-977. IEEE, (2016)Accurate Diagnosis of Interconnect Open Defects Based on the Robust Enhanced Aggressor Victim Model.P. Raiola, D. Erb, S. Reddy, and B. Becker. VLSI Design, page 135-140. IEEE Computer Society, (2017)Characterization of possibly detected faults by accurately computing their detection probability.J. Burchard, D. Erb, and B. Becker. DATE, page 385-390. IEEE, (2018)On the Generation of Waveform-Accurate Hazard and Charge-Sharing Aware Tests for Transistor Stuck-Off Faults in CMOS Logic Circuits.J. Burchard, D. Erb, S. Reddy, A. Singh, and B. Becker. IEEE Trans. on CAD of Integrated Circuits and Systems, 37 (10): 2152-2165 (2018)