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Transparent Word-Oriented Memory BIST Based on Symmetric March Algorithms.

, , , and . EDCC, volume 1667 of Lecture Notes in Computer Science, page 339-350. Springer, (1999)

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Dr. Quynh Ngo University of Stuttgart

Dataset for NMF-based Analysis of Mobile Eye-Tracking Data, , , and . Dataset, (2024)Related to: Daniel Klötzl, Tim Krake, Frank Heyen, Michael Becher, Maurice Koch, Daniel Weiskopf, and Kuno Kurzhals. 2024. NMF-Based Analysis of Mobile Eye-Tracking Data. In 2024 Symposium on Eye Tracking Research and Applications (ETRA ’24), June 4-7, 2024, Glasgow, United Kingdom. ACM, New York, NY, USA, 9 pages. doi: 10.1145/3649902.3653518.

Univ. -Prof. Ph. D. Mathias Niepert University of Stuttgart

Learning Disentangled Discrete Representations, , , and . Machine Learning and Knowledge Discovery in Databases : Research Track, volume 4 : Research Track of Lecture notes in computer science. Lecture notes in artificial intelligence, page 593-609. Cham, Springer, (2023)
 

Other publications of authors with the same name

Self-Adjusting Output Data Compression: An Efficient BIST Technique for RAMs., , and . DATE, page 173-179. IEEE Computer Society, (1998)Obfuscation as Intellectual Rights Protection in VHDL Language., and . CISIM, page 337-340. IEEE Computer Society, (2007)Symmetric Transparent BIST for RAMs., , and . DATE, page 702-707. IEEE Computer Society / ACM, (1999)Efficient Online and Offline Testing of Embedded DRAMs., , , , and . IEEE Trans. Computers, 51 (7): 801-809 (2002)Zero aliasing ROM BIST., , and . J. Electronic Testing, 5 (4): 377-388 (1994)Address sequences., and . Automatic Control and Computer Sciences, 48 (4): 207-213 (2014)March LR: a test for realistic linked faults., , , and . VTS, page 272-280. IEEE Computer Society, (1996)Aliasing-free Signature Analysis for RAM BIST., , and . ITC, page 368-377. IEEE Computer Society, (1994)Optimal Backgrounds Selection for Multi Run Memory Testing., and . DDECS, page 332-338. IEEE Computer Society, (2008)Multi-Run March Tests for Pattern Sensitive Faults in RAM., and . EWDTS, page 1-6. IEEE, (2018)