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Disambiguation of "Hapke, Friedrich"

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Efficient Pattern Mapping for Deterministic Logic BIST.

, , , , , and . ITC, page 48-56. IEEE Computer Society, (2004)

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To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Dr. Friedrich Grüner University of Stuttgart

Univ. -Prof. Dr. -Ing. Maximilian Friedrich University of Stuttgart

Univ. -Prof. Dr. Andreas Friedrich University of Stuttgart

Racing for Green Hydrogen Economics with Polymer Electrolyte Water Electrolysis - How to Be Achieved, , and . Chemie - Ingenieur - Technik, 96 (1-2): 13-21 (2024)

Friedrich Becker University of Stuttgart

Horst Friedrich University of Stuttgart

 

Other publications of authors with the same name

Cell-aware experiences in a high-quality automotive test suite., , , , , , , , , and 5 other author(s). ETS, page 1-6. IEEE, (2014)PASSAT: Efficient SAT-Based Test Pattern Generation for Industrial Circuits., , , , , and . ISVLSI, page 212-217. IEEE Computer Society, (2005)Embedded multi-detect ATPG and Its Effect on the Detection of Unmodeled Defects., , , , and . ITC, page 1-10. IEEE Computer Society, (2007)X-masking during logic BIST and its impact on defect coverage., , , , , , , and . IEEE Trans. VLSI Syst., 14 (2): 193-202 (2006)Combining Multi-Valued Logics in SAT-based ATPG for Path Delay Faults., , , , , and . MEMOCODE, page 181-187. IEEE Computer Society, (2007)Efficient Pattern Mapping for Deterministic Logic BIST., , , , , and . ITC, page 48-56. IEEE Computer Society, (2004)X-Masking During Logic BIST and Its Impact on Defect Coverage., , , , , , , and . ITC, page 442-451. IEEE Computer Society, (2004)ATPG Padding And ATE Vector Repeat Per Port For Reducing Test Data Volume., , , , and . ITC, page 1069-1078. IEEE Computer Society, (2003)Fault collapsing of multi-conditional faults., , and . DDECS, page 42-47. IEEE Computer Society, (2013)A new SAT-based ATPG for generating highly compacted test sets., , , , and . DDECS, page 230-235. IEEE, (2012)