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Power Delivery for Multicore Systems., and . IEEE Trans. VLSI Syst., 19 (12): 2243-2255 (2011)A built-in scheme for testing and repairing voltage regulators of low-power srams., , , , , , and . VTS, page 1-6. IEEE Computer Society, (2013)Effect-cause intra-cell diagnosis at transistor level., , , , , , and . ISQED, page 460-467. IEEE, (2013)A study of path delay variations in the presence of uncorrelated power and ground supply noise., , , , , and . DDECS, page 189-194. IEEE Computer Society, (2011)Failure Analysis and Test Solutions for Low-Power SRAMs., , , , , , , and . Asian Test Symposium, page 459-460. IEEE Computer Society, (2011)Defect analysis in power mode control logic of low-power SRAMs., , , , , , and . European Test Symposium, page 1. IEEE Computer Society, (2012)Through-Silicon-Via resistive-open defect analysis., , , , , and . European Test Symposium, page 1. IEEE Computer Society, (2012)Low-power SRAMs power mode control logic: Failure analysis and test solutions., , , , , , and . ITC, page 1-10. IEEE Computer Society, (2012)Uncorrelated Power Supply Noise and Ground Bounce Consideration for Test Pattern Generation., , , , and . IEEE Trans. VLSI Syst., 21 (5): 958-970 (2013)Analysis and optimization of power-gated ICs with multiple power gating configurations., , and . ICCAD, page 783-790. IEEE Computer Society, (2007)