%0 Conference Paper %1 conf/ats/ZordanBDGPTVB11 %A Zordan, Leonardo Bonet %A Bosio, Alberto %A Dilillo, Luigi %A Girard, Patrick %A Pravossoudovitch, Serge %A Todri, Aida %A Virazel, Arnaud %A Badereddine, Nabil %B Asian Test Symposium %D 2011 %I IEEE Computer Society %K dblp %P 459-460 %T Failure Analysis and Test Solutions for Low-Power SRAMs. %U http://dblp.uni-trier.de/db/conf/ats/ats2011.html#ZordanBDGPTVB11 %@ 978-1-4577-1984-4

@inproceedings{conf/ats/ZordanBDGPTVB11, added-at = {2016-01-13T00:00:00.000+0100}, author = {Zordan, Leonardo Bonet and Bosio, Alberto and Dilillo, Luigi and Girard, Patrick and Pravossoudovitch, Serge and Todri, Aida and Virazel, Arnaud and Badereddine, Nabil}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2439bc1c3e7e0dc89b06fc05a49d410f6/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2011}, ee = {http://doi.ieeecomputersociety.org/10.1109/ATS.2011.97}, interhash = {e8dbff1293e62eae1e1d4b527e4ad031}, intrahash = {439bc1c3e7e0dc89b06fc05a49d410f6}, isbn = {978-1-4577-1984-4}, keywords = {dblp}, pages = {459-460}, publisher = {IEEE Computer Society}, timestamp = {2016-09-07T09:33:39.000+0200}, title = {Failure Analysis and Test Solutions for Low-Power SRAMs.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2011.html#ZordanBDGPTVB11}, year = 2011 }