%0 Journal Article %1 journals/tvlsi/TodriBDGV13 %A Todri, Aida %A Bosio, Alberto %A Dilillo, Luigi %A Girard, Patrick %A Virazel, Arnaud %D 2013 %J IEEE Trans. VLSI Syst. %K dblp %N 5 %P 958-970 %T Uncorrelated Power Supply Noise and Ground Bounce Consideration for Test Pattern Generation. %U http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi21.html#TodriBDGV13 %V 21

@article{journals/tvlsi/TodriBDGV13, added-at = {2013-04-25T00:00:00.000+0200}, author = {Todri, Aida and Bosio, Alberto and Dilillo, Luigi and Girard, Patrick and Virazel, Arnaud}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2b2cd90ba8ab6e9a75aacd61ab97e1678/dblp}, ee = {http://dx.doi.org/10.1109/TVLSI.2012.2197427}, interhash = {8166711f800ac0b5c70b7800ebe8aa35}, intrahash = {b2cd90ba8ab6e9a75aacd61ab97e1678}, journal = {IEEE Trans. VLSI Syst.}, keywords = {dblp}, number = 5, pages = {958-970}, timestamp = {2016-09-07T09:32:04.000+0200}, title = {Uncorrelated Power Supply Noise and Ground Bounce Consideration for Test Pattern Generation.}, url = {http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi21.html#TodriBDGV13}, volume = 21, year = 2013 }