Author of the publication

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

RF components implemented in an analog SiGe bipolar technology

J. Burghartz, M. Soyuer, K. Jenkins, M. Kies, P. Dolan, K. Stein, J. Malinowski, and D. Harame. Proceedings of the 1996 BIPOLAR/BiCMOS Circuits and Technology Meeting, page 138-141. Piscataway, New Jersey, IEEE, (1996)
DOI: 10.1109/BIPOL.1996.554628

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

A. Laukemann

Allison Keith University of Stuttgart

Christopher Jenkins University of Stuttgart

A. Laukemann

A. Laukemann

Other publications of authors with the same name

On-chip circuit to monitor long-term NBTI and PBTI degradation.K. Jenkins, and P. Lu. Microelectronics Reliability, 53 (9-11): 1252-1256 (2013)Application of an SOI 0.12-µm CMOS technology to SoCs with low-power and high-frequency circuits.J. Plouchart, N. Zamdmer, J. Kim, M. Sherony, Y. Tan, A. Ray, M. Talbi, L. Wagner, K. Wu, N. Lustig and 11 other author(s). IBM Journal of Research and Development, 47 (5-6): 611-630 (2003)A simple array-based test structure for the AC variability characterization of MOSFETs.K. Balakrishnan, K. Jenkins, and D. Boning. ISQED, page 539-544. IEEE, (2011)Detecting and Preventing Measurement Errors.K. Jenkins. IEEE Design & Test of Computers, 14 (4): 78-86 (1997)Statistical Characterization and On-Chip Measurement Methods for Local Random Variability of a Process Using Sense-Amplifier-Based Test Structure.S. Mukhopadhyay, K. Kim, K. Jenkins, C. Chuang, and K. Roy. ISSCC, page 400-611. IEEE, (2007)On-Chip Circuit for Measuring Period Jitter and Skew of Clock Distribution Networks.K. Jenkins, K. Shepard, and Z. Xu. CICC, page 157-160. IEEE, (2007)A statistical critical path monitor in 14nm CMOS.B. Fleischer, C. Vezyrtzis, K. Balakrishnan, and K. Jenkins. ICCD, page 507-511. IEEE Computer Society, (2016)SiGe power HBT's for low-voltage, high-performance RF applicationsJ. Burghartz, J. Plouchart, K. Jenkins, C. Webster, and M. Soyuer. IEEE Electron Device Letters, 19 (4): 103-105 (April 1998)Spiral inductors and transmission lines in silicon technology using copper-damascene interconnects and low-loss substratesJ. Burghartz, D. Edelstein, K. Jenkins, and Y. Kwark. IEEE Transactions on Microwave Theory and Techniques, 45 (10): 1961-1968 (October 1997)Device design issues for a high-performance technology with Si or SiGe epitaxial baseJ. Burghartz, J. Cressler, K. Jenkins, J. Sun, J. Stork, J. Comfort, T. Brunner, and C. Stanis. Microelectronic Engineering, 15 (1-4): 11-14 (October 1991)