%0 Conference Paper %1 conf/isqed/BalakrishnanJB11 %A Balakrishnan, Karthik %A Jenkins, Keith A. %A Boning, Duane S. %B ISQED %D 2011 %I IEEE %K dblp %P 539-544 %T A simple array-based test structure for the AC variability characterization of MOSFETs. %U http://dblp.uni-trier.de/db/conf/isqed/isqed2011.html#BalakrishnanJB11 %@ 978-1-61284-914-0

@inproceedings{conf/isqed/BalakrishnanJB11, added-at = {2011-05-23T00:00:00.000+0200}, author = {Balakrishnan, Karthik and Jenkins, Keith A. and Boning, Duane S.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2b8713eb8769c96586c566b5bb0d960a4/dblp}, booktitle = {ISQED}, crossref = {conf/isqed/2011}, ee = {http://dx.doi.org/10.1109/ISQED.2011.5770779}, interhash = {c92d9479e5f440524c89298fbfe886a3}, intrahash = {b8713eb8769c96586c566b5bb0d960a4}, isbn = {978-1-61284-914-0}, keywords = {dblp}, pages = {539-544}, publisher = {IEEE}, timestamp = {2016-02-02T13:52:47.000+0100}, title = {A simple array-based test structure for the AC variability characterization of MOSFETs.}, url = {http://dblp.uni-trier.de/db/conf/isqed/isqed2011.html#BalakrishnanJB11}, year = 2011 }