Author of the publication

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Hardware Trojan prevention using layout-level design approach., , , , , and . ECCTD, page 1-4. IEEE, (2015)Improving the Test of NoC-Based SoCs with Help of Compression Schemes., , , and . ISVLSI, page 139-144. IEEE Computer Society, (2008)Laser-Induced Fault Simulation., , , and . DSD, page 609-614. IEEE Computer Society, (2013)A Heuristic for Test Scheduling at System Level., , and . DATE, page 1124. IEEE Computer Society, (2002)Alleviating DFT Cost Using Testability Driven HLS., , and . Asian Test Symposium, page 46-51. IEEE Computer Society, (1998)On-chip test comparison for protecting confidential data in secure ICs., , , and . European Test Symposium, page 1. IEEE Computer Society, (2012)Scan Attacks and Countermeasures in Presence of Scan Response Compactors., , , and . European Test Symposium, page 19-24. IEEE Computer Society, (2011)Operators allocation in the silicon compiler SCOOP., , and . Integration, 8 (2): 99-109 (1989)A New Recovery Scheme Against Short-to-Long Duration Transient Faults in Combinational Logic., , , , and . J. Electronic Testing, 29 (3): 331-340 (2013)Frontside Versus Backside Laser Injection: A Comparative Study., , , , and . JETC, 13 (1): 6:1-6:15 (2016)