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Memory Reliability Improvement Based on Maximized Error-Correcting Codes.

, , and . J. Electronic Testing, 29 (4): 601-608 (2013)

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Error-correction schemes with erasure information for fast memories., and . ETS, page 1-6. IEEE Computer Society, (2013)Efficient Pattern Mapping for Deterministic Logic BIST., , , , , and . ITC, page 48-56. IEEE Computer Society, (2004)Deterministic logic BIST for transition fault testing., , , and . IET Computers & Digital Techniques, 1 (3): 180-186 (2007)Implementing a Scheme for External Deterministic Self-Test., , , , and . VTS, page 101-106. IEEE Computer Society, (2005)Generalized parity-check matrices for SEC-DED codes with fixed parity., , , and . IOLTS, page 198-201. IEEE Computer Society, (2011)Flip-flop selection for in-situ slack-time monitoring based on the activation probability of timing-critical paths., , , , and . IOLTS, page 160-163. IEEE, (2014)Is aproximate computing suitable for selective hardening of arithmetic circuits?, , , , and . DTIS, page 1-6. IEEE, (2018)Error prediction based on concurrent self-test and reduced slack time., , , , and . DATE, page 1626-1631. IEEE, (2011)System-level hardware-based protection of memories against soft-errors., , , , and . DATE, page 1222-1225. IEEE, (2009)Shadow-scan design with low latency overhead and in-situ slack-time monitoring., , , , , , and . ETS, page 1-6. IEEE, (2014)