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Memory Reliability Improvement Based on Maximized Error-Correcting Codes.

V. Gherman, S. Evain, and Y. Bonhomme. J. Electronic Testing, 29 (4): 601-608 (2013)

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Yannick Thiebes University of Stuttgart

Yannick Schellander University of Stuttgart

Yannick Bernhardt University of Stuttgart

Yannick Stöckl University of Stuttgart

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Programmable extended SEC-DED codes for memory errors.V. Gherman, S. Evain, F. Auzanneau, and Y. Bonhomme. VTS, page 140-145. IEEE Computer Society, (2011)Memory Reliability Improvement Based on Maximized Error-Correcting Codes.V. Gherman, S. Evain, and Y. Bonhomme. J. Electronic Testing, 29 (4): 601-608 (2013)Scan design with shadow flip-flops for low performance overhead and concurrent delay fault detection.S. Sarrazin, S. Evain, L. de Barros Naviner, Y. Bonhomme, and V. Gherman. DATE, page 1077-1082. EDA Consortium San Jose, CA, USA / ACM DL, (2013)Memory reliability improvements based on maximized error-correcting codes.V. Gherman, S. Evain, and Y. Bonhomme. European Test Symposium, page 1-6. IEEE Computer Society, (2012)Programmable restricted SEC codes to mask permanent faults in semiconductor memories.S. Evain, Y. Bonhomme, and V. Gherman. IOLTS, page 147-153. IEEE Computer Society, (2010)Power-Driven Routing-Constrained Scan Chain Design.Y. Bonhomme, P. Girard, L. Guiller, C. Landrault, and S. Pravossoudovitch. J. Electronic Testing, 20 (6): 647-660 (2004)An efficient scan tree design for test time reduction.Y. Bonhomme, T. Yoneda, H. Fujiwara, and P. Girard. European Test Symposium, page 174-179. IEEE Computer Society, (2004)Transaction-based modeling for large scale simulations of heterogeneous systems.R. Buchmann, M. Cartron, and Y. Bonhomme. SimuTools, page 33. ICST/ACM, (2009)A Gated Clock Scheme for Low Power Testing of Logic Cores.Y. Bonhomme, P. Girard, L. Guiller, C. Landrault, S. Pravossoudovitch, and A. Virazel. J. Electronic Testing, 22 (1): 89-99 (2006)A Gated Clock Scheme for Low Power Scan-Based BIST.Y. Bonhomme, P. Girard, L. Guiller, C. Landrault, and S. Pravossoudovitch. IOLTW, page 87-89. IEEE Computer Society, (2001)

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Disambiguation of "Bonhomme, Yannick"

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Memory Reliability Improvement Based on Maximized Error-Correcting Codes.

Please choose a person to relate this publication to

Yannick Thiebes University of Stuttgart

Yannick Schellander University of Stuttgart

Yannick Bernhardt University of Stuttgart

Yannick Stöckl University of Stuttgart

Other publications of authors with the same name

Disambiguation

PUMA

Disambiguation of "Bonhomme, Yannick"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Memory Reliability Improvement Based on Maximized Error-Correcting Codes.

Please choose a person to relate this publication to

Yannick Thiebes University of Stuttgart

Yannick Schellander University of Stuttgart

Yannick Bernhardt University of Stuttgart

Yannick Stöckl University of Stuttgart

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
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Memory Reliability Improvement Based on Maximized Error-Correcting Codes.