%0 Journal Article %1 journals/et/GhermanEB13 %A Gherman, Valentin %A Evain, Samuel %A Bonhomme, Yannick %D 2013 %J J. Electronic Testing %K dblp %N 4 %P 601-608 %T Memory Reliability Improvement Based on Maximized Error-Correcting Codes. %U http://dblp.uni-trier.de/db/journals/et/et29.html#GhermanEB13 %V 29

@article{journals/et/GhermanEB13, added-at = {2013-09-05T00:00:00.000+0200}, author = {Gherman, Valentin and Evain, Samuel and Bonhomme, Yannick}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/23a3f083668df10dcf938fdeb715a34c7/dblp}, ee = {http://dx.doi.org/10.1007/s10836-013-5396-6}, interhash = {32ddd33536bb77e5347c3b0b8bd536c6}, intrahash = {3a3f083668df10dcf938fdeb715a34c7}, journal = {J. Electronic Testing}, keywords = {dblp}, number = 4, pages = {601-608}, timestamp = {2016-02-02T10:07:29.000+0100}, title = {Memory Reliability Improvement Based on Maximized Error-Correcting Codes.}, url = {http://dblp.uni-trier.de/db/journals/et/et29.html#GhermanEB13}, volume = 29, year = 2013 }