S. Dong, T. Haist, W. Osten, T. Ruppel, und .... Proc. SPIE, (2012)2 cites: https://scholar.google.com/scholar?cites=11190995107346479570&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, und W. Osten. The Journal of Supercomputing, (2012)1 cites: https://scholar.google.com/scholar?cites=8022635775438100007&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, M. Gronle, D. Bui, und W. Osten. tm-Technisches Messen, (2015)4 cites: https://scholar.google.com/scholar?cites=8530019438080874564&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, und W. Osten. Journal of Micro/Nanolithography, MEMS …, (2015)7 cites: https://scholar.google.com/scholar?cites=16007974591760507561&as_sdt=2005&sciodt=0,5&hl=en.
W. Lyda, A. Burla, T. Haist, M. Gronle, und W. Osten. International Journal of …, (2012)12 cites: https://scholar.google.com/scholar?cites=9954681190140723856&as_sdt=2005&sciodt=0,5&hl=en.
S. Dong, T. Haist, W. Osten, T. Ruppel, und O. Sawodny. Applied optics, (2012)39 cites: https://scholar.google.com/scholar?cites=18374474749701692653&as_sdt=2005&sciodt=0,5&hl=en.
W. Osten, T. Haist, und K. Korner. Proceedings of International Conference On Laser …, (2003)9 cites: https://scholar.google.com/scholar?cites=1836599854242513742&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, M. Schönleber, und H. Tiziani. Optics Communications, (1997)113 cites: https://scholar.google.com/scholar?cites=2868264901183821891&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, W. Osten, M. Reicherter, und .... Optical Information …, (2003)3 cites: https://scholar.google.com/scholar?cites=13914692911788684678&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, M. Reicherter, M. Wu, and L. Seifert. Comput. Sci. Eng., (2006)3 cites: https://scholar.google.com/scholar?cites=14566195398217273875&as_sdt=2005&sciodt=0,5&hl=en.
H. Tiziani, T. Haist, and S. Reuter. Optics and lasers in engineering, (2001)31 cites: https://scholar.google.com/scholar?cites=10249054131397115772&as_sdt=2005&sciodt=0,5&hl=en.
S. Zwick, L. He, M. Warber, T. Haist, and W. Osten. Proc. der DGaO, (2007)2 cites: https://scholar.google.com/scholar?cites=2224526662259757506&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, and H. Tiziani. TECHNISCHES MESSEN, (2002)1 cites: https://scholar.google.com/scholar?cites=13362241692780377838&as_sdt=2005&sciodt=0,5&hl=en.