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Launch-on-Shift Test Generation for Testing Scan Designs Containing Synchronous and Asynchronous Clock Domains.

, , , , , , , and . ACM Trans. Design Autom. Electr. Syst., 17 (4): 48:1-48:16 (2012)

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Logic BIST Architecture Using Staggered Launch-on-Shift for Testing Designs Containing Asynchronous Clock Domains., , , , , , , , , and 2 other author(s). DFT, page 358-366. IEEE Computer Society, (2010)At-Speed Logic BIST Architecture for Multi-Clock Designs., , , , and . ICCD, page 475-478. IEEE Computer Society, (2005)A Novel and Practical Control Scheme for Inter-Clock At-Speed Testing., , , , , and . ITC, page 1-10. IEEE Computer Society, (2006)A Sequential Circuit Test Generation System., and . ITC, page 57-61. IEEE Computer Society, (1985)Turbo1500: Core-Based Design for Test and Diagnosis., , , , , , , , , and 5 other author(s). IEEE Design & Test of Computers, 26 (1): 26-35 (2009)At-Speed Logic BIST for IP Cores., , , , , , , , and . DATE, page 860-861. IEEE Computer Society, (2005)Using Launch-on-Capture for Testing Scan Designs Containing Synchronous and Asynchronous Clock Domains., , , , , , , , , and 2 other author(s). IEEE Trans. on CAD of Integrated Circuits and Systems, 30 (3): 455-463 (2011)Logic BIST Architecture for System-Level Test and Diagnosis., , , , , , , , , and 5 other author(s). Asian Test Symposium, page 21-26. IEEE Computer Society, (2009)Lessons Learned from Practical Applications of BIST/B-S Technology., , , and . Asian Test Symposium, page 251-257. IEEE Computer Society, (1996)Test compression and logic BIST at your fingertips., , , , and . ITC, page 2. IEEE Computer Society, (2005)