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Turbo1500: Core-Based Design for Test and Diagnosis.

L. Wang, R. Apte, S. Wu, B. Sheu, W. Jone, J. Guo, K. Lee, W. Wang, X. Wen, H. Chao, J. Liu, Y. Niu, Y. Sung, C. Wang, and F. Li. IEEE Design & Test of Computers, 26 (1): 26-35 (2009)

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Turbo1500: Core-Based Design for Test and Diagnosis.L. Wang, R. Apte, S. Wu, B. Sheu, W. Jone, J. Guo, K. Lee, W. Wang, X. Wen, H. Chao and 5 other author(s). IEEE Design & Test of Computers, 26 (1): 26-35 (2009)A Novel and Practical Control Scheme for Inter-Clock At-Speed Testing.H. Furukawa, X. Wen, L. Wang, B. Sheu, Z. Jiang, and S. Wu. ITC, page 1-10. IEEE Computer Society, (2006)On Optimizing Fault Coverage, Pattern Count, and ATPG Run Time Using a Hybrid Single-Capture Scheme for Testing Scan Designs.S. Wu, L. Wang, Z. Jiang, J. Song, B. Sheu, X. Wen, M. Hsiao, J. Li, J. Huang, and R. Apte. DFT, page 143-151. IEEE Computer Society, (2008)Hybrid Built-In Self-Test Architecture for Multi-port Static RAMs.L. Yu, J. Hung, B. Sheu, B. Huynh, L. Nguyen, S. Wu, L. Wang, and X. Wen. DFT, page 331-339. IEEE Computer Society, (2010)Using Launch-on-Capture for Testing BIST Designs Containing Synchronous and Asynchronous Clock Domains.L. Wang, X. Wen, S. Wu, H. Furukawa, H. Chao, B. Sheu, J. Guo, and W. Jone. IEEE Trans. on CAD of Integrated Circuits and Systems, 29 (2): 299-312 (2010)UltraScan: using time-division demultiplexing/multiplexing (TDDM/TDM) with VirtualScan for test cost reduction.L. Wang, K. Abdel-Hafez, X. Wen, B. Sheu, S. Wu, S. Lin, and M. Chang. ITC, page 8. IEEE Computer Society, (2005)Practical Challenges in Logic BIST Implementation.S. Wu, H. Furukawa, B. Sheu, L. Wang, H. Chao, L. Yu, X. Wen, and M. Murakami. ATS, page 265. IEEE Computer Society, (2008)Test compression and logic BIST at your fingertips.S. Wu, L. Wang, J. Cho, Z. Jiang, and B. Sheu. ITC, page 2. IEEE Computer Society, (2005)VirtualScan: Test Compression Technology Using Combinational Logic and One-Pass ATPG.L. Wang, X. Wen, S. Wu, Z. Wang, Z. Jiang, B. Sheu, and X. Gu. IEEE Design & Test of Computers, 25 (2): 122-130 (2008)Turbo1500: Toward Core-Based Design for Test and Diagnosis Using the IEEE 1500 Standard.L. Wang, R. Apte, S. Wu, B. Sheu, K. Lee, X. Wen, W. Jone, C. Yeh, W. Wang, H. Chao and 6 other author(s). ITC, page 1-9. IEEE Computer Society, (2008)

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Turbo1500: Core-Based Design for Test and Diagnosis.

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copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Turbo1500: Core-Based Design for Test and Diagnosis.

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Turbo1500: Core-Based Design for Test and Diagnosis.