PUMA

academical publication management
collect, organize, and share publications

( en | de )

 

Disambiguation of "Wen, Xiaoqing"

Author of the publication

copydeleteadd this publication to your clipboard
UltraScan: using time-division demultiplexing/multiplexing (TDDM/TDM) with VirtualScan for test cost reduction.

, , , , , , and . ITC, page 8. IEEE Computer Society, (2005)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Dr. -Ing. Christoph Wenzel University of Stuttgart

Tizian Wenzel University of Stuttgart

Deep and greedy kernel methods : algorithms, analysis and applications. Universität Stuttgart, Stuttgart, Dissertation, (2023)

Ingeborg Wenger University of Stuttgart

Dr. rer. nat. Tim Wendlandt University of Stuttgart

Florian Wenz University of Stuttgart

 

Other publications of authors with the same name

VirtualScan: Test Compression Technology Using Combinational Logic and One-Pass ATPG., , , , , , and . IEEE Design & Test of Computers, 25 (2): 122-130 (2008)A GA-Based X-Filling for Reducing Launch Switching Activity toward Specific Objectives in At-Speed Scan Testing., , , , and . IEICE Transactions, 94-D (4): 833-840 (2011)Formal Test Point Insertion for Region-based Low-Capture-Power Compact At-Speed Scan Test., , , , and . ATS, page 173-178. IEEE Computer Society, (2016)A Flexible Power Control Method for Right Power Testing of Scan-Based Logic BIST., , , , and . ATS, page 203-208. IEEE Computer Society, (2016)High Launch Switching Activity Reduction in At-Speed Scan Testing Using CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme., , , , , , , and . IEICE Transactions, 93-D (1): 2-9 (2010)Reseeding-Oriented Test Power Reduction for Linear-Decompression-Based Test Compression Architectures., , , , , and . IEICE Transactions, 99-D (11): 2672-2681 (2016)Fault Diagnosis of Physical Defects Using Unknown Behavior Model., , , and . J. Comput. Sci. Technol., 20 (2): 187-194 (2005)Test Pattern Modification for Average IR-Drop Reduction., , , , and . IEEE Trans. VLSI Syst., 24 (1): 38-49 (2016)A Novel Per-Test Fault Diagnosis Method Based on the Extended X-Fault Model for Deep-Submicron LSI Circuits., , , , and . IEICE Transactions, 91-D (3): 667-674 (2008)VLSI testing and test power.. IGCC, page 1-6. IEEE Computer Society, (2011)