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Adaptive Alternate Analog Test., and . IEEE Design & Test of Computers, 29 (4): 71-79 (2012)An Analog Checker with Input-Relative Tolerance for Duplicate Signals., and . J. Electronic Testing, 20 (5): 479-488 (2004)Fast deployment of alternate analog test using Bayesian model fusion., , , , , and . DATE, page 1030-1035. ACM, (2015)Concurrent Error Detection in Linear Analog Circuits Using State Estimation., and . ITC, page 1164-1173. IEEE Computer Society, (2003)Defect Filter for Alternate RF Test., , , and . European Test Symposium, page 101-106. IEEE Computer Society, (2009)Concurrent detection of erroneous responses in linear analog circuits., and . IEEE Trans. on CAD of Integrated Circuits and Systems, 25 (5): 878-891 (2006)Diagnosis of Local Spot Defects in Analog Circuits., , , , , and . IEEE Trans. Instrumentation and Measurement, 61 (10): 2701-2712 (2012)Test and Calibration of RF Circuits Using Built-in Non-intrusive Sensors., , , , , and . ISVLSI, page 627. IEEE Computer Society, (2015)One-Shot Non-Intrusive Calibration Against Process Variations for Analog/RF Circuits., , and . IEEE Trans. on Circuits and Systems, 63-I (11): 2022-2035 (2016)Evaluation of low-cost mixed-signal test techniques for circuits with long simulation times., , , , , and . ITC, page 1-7. IEEE, (2015)