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Defect Filter for Alternate RF Test.

H. Stratigopoulos, S. Mir, E. Acar, and S. Ozev. European Test Symposium, page 101-106. IEEE Computer Society, (2009)

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Lourdes Mira-Marceli Garcia University of Stuttgart

Sepehr Mirzaei University of Stuttgart

Daniel Ismail Mir University of Stuttgart

Mir Alireza Hakamian University of Stuttgart

Other publications of authors with the same name

Defect filter for alternate RF test.H. Stratigopoulos, S. Mir, E. Acar, and S. Ozev. European Test Symposium, page 265-270. IEEE Computer Society, (2010)Efficient minimization of test frequencies for linear analog circuits.M. Bentobache, A. Bounceur, R. Euler, Y. Kieffer, and S. Mir. ETS, page 1. IEEE Computer Society, (2013)Fault modeling and diagnosis for nanometric analog circuits.K. Huang, H. Stratigopoulos, and S. Mir. ITC, page 1-10. IEEE Computer Society, (2013)Fault modeling of suspended thermal MEMS.B. Charlot, S. Mir, É. Cota, M. Lubaszewski, and B. Courtois. ITC, page 319-328. IEEE Computer Society, (1999)Accurate estimation of analog test metrics with extreme circuits.K. Beznia, A. Bounceur, L. Abdallah, K. Huang, S. Mir, and R. Euler. ICECS, page 272-275. IEEE, (2012)Ordering of analog specification tests based on parametric defect level estimation.N. Akkouche, S. Mir, and E. Simeu. VTS, page 301-306. IEEE Computer Society, (2010)Testing RF circuits with true non-intrusive built-in sensors.L. Abdallah, H. Stratigopoulos, S. Mir, and J. Altet. DATE, page 1090-1095. IEEE, (2012)Exploiting Pipeline ADC Properties for a Reduced-Code Linearity Test Technique.A. Laraba, H. Stratigopoulos, S. Mir, and H. Naudet. IEEE Trans. on Circuits and Systems, 62-I (10): 2391-2400 (2015)Design of self-checking fully differential circuits and boards.M. Lubaszewski, S. Mir, V. Kolarik, C. Nielsen, and B. Courtois. IEEE Trans. VLSI Syst., 8 (2): 113-128 (2000)Analog checkers with absolute and relative tolerances.V. Kolarik, S. Mir, M. Lubaszewski, and B. Courtois. IEEE Trans. on CAD of Integrated Circuits and Systems, 14 (5): 607-612 (1995)

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Disambiguation of "Mir, Salvador"

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Defect Filter for Alternate RF Test.

Please choose a person to relate this publication to

Lourdes Mira-Marceli Garcia University of Stuttgart

Sepehr Mirzaei University of Stuttgart

Daniel Ismail Mir University of Stuttgart

Mir Alireza Hakamian University of Stuttgart

Other publications of authors with the same name

Disambiguation

PUMA

Disambiguation of "Mir, Salvador"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Defect Filter for Alternate RF Test.

Please choose a person to relate this publication to

Lourdes Mira-Marceli Garcia University of Stuttgart

Sepehr Mirzaei University of Stuttgart

Daniel Ismail Mir University of Stuttgart

Mir Alireza Hakamian University of Stuttgart

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Defect Filter for Alternate RF Test.