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Defect Filter for Alternate RF Test.

, , , and . European Test Symposium, page 101-106. IEEE Computer Society, (2009)

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Low-Cost Characterization and Calibration of RF Integrated Circuits through I - Q Data Analysis., and . IEEE Trans. on CAD of Integrated Circuits and Systems, 28 (7): 993-1005 (2009)Test yield estimation for analog/RF circuits over multiple correlated measurements., , and . ITC, page 1-10. IEEE Computer Society, (2007)Parametric test development for RF circuits targeting physical fault locations and using specification-based fault definitions., and . ICCAD, page 73-79. IEEE Computer Society, (2005)Efficient Testing of RF MIMO Transceivers Used in WLAN Applications., and . ICCD, page 432-437. IEEE, (2006)Low Cost MIMO Testing for RF Integrated Circuits., and . IEEE Trans. VLSI Syst., 18 (9): 1348-1356 (2010)A Low-Cost RF MIMO Test Method Using a Single Measurement Set-up., , and . VTS, page 3-8. IEEE Computer Society, (2007)Defect filter for alternate RF test., , , and . European Test Symposium, page 265-270. IEEE Computer Society, (2010)Defect-based RF testing using a new catastrophic fault model., and . ITC, page 9. IEEE Computer Society, (2005)Optimized EVM Testing for IEEE 802.11a/n RF ICs., , , and . ITC, page 1-10. IEEE Computer Society, (2008)Defect Filter for Alternate RF Test., , , and . European Test Symposium, page 101-106. IEEE Computer Society, (2009)