%0 Conference Paper %1 conf/itc/LiuAO07 %A Liu, Fang %A Acar, Erkan %A Ozev, Sule %B ITC %D 2007 %E Sibert, Jill %E Rajski, Janusz %I IEEE Computer Society %K dblp %P 1-10 %T Test yield estimation for analog/RF circuits over multiple correlated measurements. %U http://dblp.uni-trier.de/db/conf/itc/itc2007.html#LiuAO07 %@ 1-4244-1128-9

@inproceedings{conf/itc/LiuAO07, added-at = {2019-02-13T00:00:00.000+0100}, author = {Liu, Fang and Acar, Erkan and Ozev, Sule}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2c9f8a5dbbb483e9d0427678d2074bc67/dblp}, booktitle = {ITC}, crossref = {conf/itc/2007}, editor = {Sibert, Jill and Rajski, Janusz}, ee = {http://doi.ieeecomputersociety.org/10.1109/TEST.2007.4437643}, interhash = {efae368f0bba4ac6c508f5a9041f17a3}, intrahash = {c9f8a5dbbb483e9d0427678d2074bc67}, isbn = {1-4244-1128-9}, keywords = {dblp}, pages = {1-10}, publisher = {IEEE Computer Society}, timestamp = {2019-09-27T17:47:26.000+0200}, title = {Test yield estimation for analog/RF circuits over multiple correlated measurements.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2007.html#LiuAO07}, year = 2007 }