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Disambiguation of "Taenzler, Friedrich"

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Optimized EVM Testing for IEEE 802.11a/n RF ICs.

, , , and . ITC, page 1-10. IEEE Computer Society, (2008)

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Dr. Friedrich Grüner University of Stuttgart

Univ. -Prof. Dr. -Ing. Maximilian Friedrich University of Stuttgart

Prof. Dr. -Ing. Horst Friedrich University of Stuttgart

Friedrich Becker University of Stuttgart

Hon. -Prof. Friedrich Grimm University of Stuttgart

 

Other publications of authors with the same name

Physics Based Fault Models for Testing High-Voltage LDMOS., , , , , and . VLSI Design, page 285-290. IEEE Computer Society, (2013)Low Cost EVM Testing of Wireless RF SoC Front-Ends Using Multitones., , , , , , , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 31 (7): 1088-1101 (2012)Optimized EVM Testing for IEEE 802.11a/n RF ICs., , , and . ITC, page 1-10. IEEE Computer Society, (2008)Development and empirical verification of an accuracy model for the power down leakage tests., , , and . VTS, page 1-6. IEEE Computer Society, (2014)Contactless characterization of microwave integrated circuits by device internal indirect electro-optic probing., , and . VTS, page 120-122. IEEE Computer Society, (1993)Loopback DFT for Low-Cost Test of Single-VCO-Based Wireless Transceivers., , and . IEEE Design & Test of Computers, 25 (2): 150-159 (2008)Embedded RF Circuit Diagnostic Technique with Multi-Tone Dither Scheme., , , , , and . J. Electronic Testing, 27 (3): 241-252 (2011)Alternate Loop-Back Diagnostic Tests for Wafer-Level Diagnosis of Modern Wireless Transceivers using Spectral Signatures., , and . VTS, page 222-227. IEEE Computer Society, (2006)Online RF checkers for diagnosing multi-gigahertz automatic test boards on low cost ATE platforms., , and . DATE, page 658-663. European Design and Automation Association, Leuven, Belgium, (2006)Low cost test and tuning of RF circuits and systems., and . VTS, page 42. IEEE Computer Society, (2010)