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Disambiguation of "Mir, Salvador"

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Diagnosis of Local Spot Defects in Analog Circuits.

, , , , , and . IEEE Trans. Instrumentation and Measurement, 61 (10): 2701-2712 (2012)

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Lourdes Mira-Marceli Garcia University of Stuttgart

Sepehr Mirzaei University of Stuttgart

Daniel Ismail Mir University of Stuttgart

Mir Alireza Hakamian University of Stuttgart

 

Other publications of authors with the same name

Evaluation of Analog/RF Test Measurements at the Design Stage., , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 28 (4): 582-590 (2009)Analog/RF test ordering in the early stages of production testing., , , and . VTS, page 25-30. IEEE Computer Society, (2012)A SNDR BIST for Sigma-Delta Analogue-to-Digital Converters., , , and . VTS, page 314-319. IEEE Computer Society, (2006)Evaluation of impulse response-based BIST techniques for MEMS in the presence of weak nonlinearities., , and . European Test Symposium, page 82-87. IEEE Computer Society, (2005)Multivariate statistical techniques for analog parametric test metrics estimation., , , , and . DTIS, page 6-11. IEEE, (2013)Yield Recovery of mm-Wave Power Amplifiers using Variable Decoupling Cells and One-Shot Statistical Calibration., , , , , and . ISCAS, page 1-5. IEEE, (2019)Statistical Evaluation of Digital Techniques for $\sum\varDelta$ ADC BIST., , , and . VLSI-SoC (Selected Papers), volume 464 of IFIP Advances in Information and Communication Technology, page 129-148. Springer, (2014)On-Line Testable Decimation Filter Design for AMS Systems., , and . IOLTS, page 83-88. IEEE Computer Society, (2003)A 65nm CMOS Ramp Generator Design and its Application Towards a BIST Implementation of the Reduced-Code Static Linearity Test Technique for Pipeline ADCs., , , , , , and . J. Electronic Testing, 32 (4): 407-421 (2016)Enhanced reduced code linearity test technique for multi-bit/stage pipeline ADCs., , , , and . European Test Symposium, page 1-6. IEEE Computer Society, (2012)