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Resistive-Open Defects in Embedded-SRAM Core Cells: Analysis and March Test Solution.

, , , , , and . Asian Test Symposium, page 266-271. IEEE Computer Society, (2004)

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Efficient March Test Procedure for Dynamic Read Destructive Fault Detection in SRAM Memories., , , , , and . J. Electronic Testing, 21 (5): 551-561 (2005)Resistive-Open Defects in Embedded-SRAM Core Cells: Analysis and March Test Solution., , , , , and . Asian Test Symposium, page 266-271. IEEE Computer Society, (2004)Dynamic read destructive fault in embedded-SRAMs: analysis and march test solution., , , , , and . European Test Symposium, page 140-145. IEEE Computer Society, (2004)ADOFs and Resistive-ADOFs in SRAM Address Decoders: Test Conditions and March Solutions., , , , , and . J. Electronic Testing, 22 (3): 287-296 (2006)Analysis of Dynamic Faults in Embedded-SRAMs: Implications for Memory Test., , , , , and . J. Electronic Testing, 21 (2): 169-179 (2005)Resistive-open defect influence in SRAM pre-charge circuits: analysis and characterization., , , , and . European Test Symposium, page 116-121. IEEE Computer Society, (2005)Data Retention Fault in SRAM Memories: Analysis and Detection Procedures., , , , and . VTS, page 183-188. IEEE Computer Society, (2005)