%0 Journal Article %1 journals/et/BorriHDGPV05 %A Borri, Simone %A Hage-Hassan, Magali Bastian %A Dilillo, Luigi %A Girard, Patrick %A Pravossoudovitch, Serge %A Virazel, Arnaud %D 2005 %J J. Electronic Testing %K dblp %N 2 %P 169-179 %T Analysis of Dynamic Faults in Embedded-SRAMs: Implications for Memory Test. %U http://dblp.uni-trier.de/db/journals/et/et21.html#BorriHDGPV05 %V 21

@article{journals/et/BorriHDGPV05, added-at = {2007-09-18T00:00:00.000+0200}, author = {Borri, Simone and Hage-Hassan, Magali Bastian and Dilillo, Luigi and Girard, Patrick and Pravossoudovitch, Serge and Virazel, Arnaud}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2c0a88e92fc09693dedaeb8195f6789ba/dblp}, ee = {http://dx.doi.org/10.1007/s10836-005-6146-1}, interhash = {6c2ffa38eb7334ea911dade96611a41c}, intrahash = {c0a88e92fc09693dedaeb8195f6789ba}, journal = {J. Electronic Testing}, keywords = {dblp}, number = 2, pages = {169-179}, timestamp = {2016-09-07T09:32:35.000+0200}, title = {Analysis of Dynamic Faults in Embedded-SRAMs: Implications for Memory Test.}, url = {http://dblp.uni-trier.de/db/journals/et/et21.html#BorriHDGPV05}, volume = 21, year = 2005 }