%0 Conference Paper %1 conf/ets/DililloGPVH05 %A Dilillo, Luigi %A Girard, Patrick %A Pravossoudovitch, Serge %A Virazel, Arnaud %A Hage-Hassan, Magali Bastian %B European Test Symposium %D 2005 %I IEEE Computer Society %K dblp %P 116-121 %T Resistive-open defect influence in SRAM pre-charge circuits: analysis and characterization. %U http://dblp.uni-trier.de/db/conf/ets/ets2005.html#DililloGPVH05 %@ 0-7695-2341-2

@inproceedings{conf/ets/DililloGPVH05, added-at = {2015-08-20T00:00:00.000+0200}, author = {Dilillo, Luigi and Girard, Patrick and Pravossoudovitch, Serge and Virazel, Arnaud and Hage-Hassan, Magali Bastian}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2e69f1a5c203edf3284e85ab4ec3ce96d/dblp}, booktitle = {European Test Symposium}, crossref = {conf/ets/2005}, ee = {http://doi.ieeecomputersociety.org/10.1109/ETS.2005.33}, interhash = {f87cd5eddcdb87f3f151b613e1670d1e}, intrahash = {e69f1a5c203edf3284e85ab4ec3ce96d}, isbn = {0-7695-2341-2}, keywords = {dblp}, pages = {116-121}, publisher = {IEEE Computer Society}, timestamp = {2016-09-07T09:34:05.000+0200}, title = {Resistive-open defect influence in SRAM pre-charge circuits: analysis and characterization.}, url = {http://dblp.uni-trier.de/db/conf/ets/ets2005.html#DililloGPVH05}, year = 2005 }