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Disambiguation of "Girard, Patrick"

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Resistive-open defect influence in SRAM pre-charge circuits: analysis and characterization.

, , , , and . European Test Symposium, page 116-121. IEEE Computer Society, (2005)

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Patrick Gralka University of Stuttgart

Patrick Maisenhölder University of Stuttgart

Patrick Lerge University of Stuttgart

Patrick Hippold University of Stuttgart

Patrick Mesmer University of Stuttgart

 

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Logical dynamics of belief change in the community., , and . Synthese, 191 (11): 2403-2431 (2014)Vérification de cohérence entre modèles de tâches et de dialogue en conception centrée-utilisateur., , , and . Ingénierie des Systèmes d'Information, 16 (5): 9-41 (2011)Delay-Fault Diagnosis by Critical-Path Tracing., , and . IEEE Design & Test of Computers, 9 (4): 27-32 (1992)A Layout-Aware Pattern Grading Procedure for Critical Paths Considering Power Supply Noise and Crosstalk., , and . J. Electronic Testing, 28 (2): 201-214 (2012)Efficient March Test Procedure for Dynamic Read Destructive Fault Detection in SRAM Memories., , , , , and . J. Electronic Testing, 21 (5): 551-561 (2005)A Ring Architecture Strategy for BIST Test Pattern Generation., , , and . J. Electronic Testing, 19 (3): 223-231 (2003)A Scan-BIST Structure to Test Delay Faults in Sequential Circuits., , , , and . J. Electronic Testing, 14 (1-2): 95-102 (1999)An advanced diagnostic method for delay faults in combinational faulty circuits., , and . J. Electronic Testing, 6 (3): 277-294 (1995)An Efficient BIST Architecture for Delay Faults in the Logic Cells of Symmetrical SRAM-Based FPGAs., , , and . J. Electronic Testing, 22 (2): 161-172 (2006)Resistive-Open Defects in Embedded-SRAM Core Cells: Analysis and March Test Solution., , , , , and . Asian Test Symposium, page 266-271. IEEE Computer Society, (2004)