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Disambiguation of "Borri, Simone"

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Resistive-Open Defects in Embedded-SRAM Core Cells: Analysis and March Test Solution.

, , , , , and . Asian Test Symposium, page 266-271. IEEE Computer Society, (2004)

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Simone Chiocchetti University of Stuttgart

Simone Reeb University of Stuttgart

Simone Blümlein University of Stuttgart

Simone Eitele University of Stuttgart

Dr. Simone Rehm University of Stuttgart

 

Other publications of authors with the same name

A Silicon-Based Yield Gain Evaluation Methodology for Embedded-SRAMs with Different Redundancy Scenarios., , and . MTDT, page 57-61. IEEE Computer Society, (2002)March iC-: An Improved Version of March C- for ADOFs Detection., , , , and . VTS, page 129-138. IEEE Computer Society, (2004)Analysis of Dynamic Faults in Embedded-SRAMs: Implications for Memory Test., , , , , and . J. Electronic Testing, 21 (2): 169-179 (2005)Tunable Microcavity-Stabilized Quantum Cascade Laser for Mid-IR High-Resolution Spectroscopy and Sensing., , , , , , , , , and 6 other author(s). Sensors, 16 (2): 238 (2016)A Silicon-Based Yiel Gain Evaluation Methodology for Embedded-SRAMs with Different Redundancy Scenarios., , and . IOLTW, page 251-255. IEEE Computer Society, (2002)Comparison of Open and Resistive-Open Defect Test Conditions in SRAM Address Decoders., , , , and . Asian Test Symposium, page 250-255. IEEE Computer Society, (2003)Dynamic read destructive fault in embedded-SRAMs: analysis and march test solution., , , , , and . European Test Symposium, page 140-145. IEEE Computer Society, (2004)ADOFs and Resistive-ADOFs in SRAM Address Decoders: Test Conditions and March Solutions., , , , , and . J. Electronic Testing, 22 (3): 287-296 (2006)Efficient March Test Procedure for Dynamic Read Destructive Fault Detection in SRAM Memories., , , , , and . J. Electronic Testing, 21 (5): 551-561 (2005)Resistive-Open Defects in Embedded-SRAM Core Cells: Analysis and March Test Solution., , , , , and . Asian Test Symposium, page 266-271. IEEE Computer Society, (2004)