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Coupling-based resistive-open defects in TAS-MRAM architectures.

J. Azevedo, A. Virazel, A. Bosio, L. Dilillo, P. Girard, A. Todri, G. Prenat, J. Alvarez-Herault, and K. Mackay. European Test Symposium, page 1. IEEE Computer Society, (2012)

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Scan Cell Reordering for Peak Power Reduction during Scan Test Cycles.N. Badereddine, P. Girard, S. Pravossoudovitch, A. Virazel, and C. Landrault. VLSI-SoC, volume 240 of IFIP, page 267-281. Springer, (2005)Failure Analysis and Test Solutions for Low-Power SRAMs.L. Zordan, A. Bosio, L. Dilillo, P. Girard, S. Pravossoudovitch, A. Todri, A. Virazel, and N. Badereddine. Asian Test Symposium, page 459-460. IEEE Computer Society, (2011)Comprehensive bridging fault diagnosis based on the SLAT paradigm.Y. Benabboud, A. Bosio, L. Dilillo, P. Girard, S. Pravossoudovitch, A. Virazel, L. Bouzaida, and I. Izaute. DDECS, page 264-269. IEEE Computer Society, (2009)On Using Efficient Test Sequences for BIST.R. David, P. Girard, C. Landrault, S. Pravossoudovitch, and A. Virazel. VTS, page 145-152. IEEE Computer Society, (2002)Advanced test methods for SRAMs.A. Bosio, L. Dilillo, P. Girard, S. Pravossoudovitch, and A. Virazel. VTS, page 300-301. IEEE Computer Society, (2012)Un-Restored Destructive Write Faults Due to Resistive-Open Defects in the Write Driver of SRAMs.A. Ney, P. Girard, C. Landrault, S. Pravossoudovitch, A. Virazel, and M. Bastian. VTS, page 361-368. IEEE Computer Society, (2007)Impact of resistive-open defects on the heat current of TAS-MRAM architectures.J. Azevedo, A. Virazel, A. Bosio, L. Dilillo, P. Girard, A. Todri-Sanial, G. Prenat, J. Alvarez-Herault, and K. Mackay. DATE, page 532-537. IEEE, (2012)A two-layer SPICE model of the ATMEL TSTACTM eFlash memory technology for defect injection and faulty behavior prediction.P. Mauroux, A. Virazel, A. Bosio, L. Dilillo, P. Girard, S. Pravossoudovitch, B. Godard, G. Festes, and L. Vachez. European Test Symposium, page 81-86. IEEE Computer Society, (2010)Random Adjacent Sequences: An Efficient Solution for Logic BIST.R. David, P. Girard, C. Landrault, S. Pravossoudovitch, and A. Virazel. VLSI-SOC, volume 218 of IFIP Conference Proceedings, page 413-424. Kluwer, (2001)Resistive-open defect influence in SRAM pre-charge circuits: analysis and characterization.L. Dilillo, P. Girard, S. Pravossoudovitch, A. Virazel, and M. Hage-Hassan. European Test Symposium, page 116-121. IEEE Computer Society, (2005)

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Coupling-based resistive-open defects in TAS-MRAM architectures.

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copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Coupling-based resistive-open defects in TAS-MRAM architectures.

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Coupling-based resistive-open defects in TAS-MRAM architectures.