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Test Data Compression for System-on-a-Chip Using Golomb Codes., and . VTS, page 113-120. IEEE Computer Society, (2000)Post-DfT-insertion retiming for delay recovery on inter-die paths in 3D ICs., and . VTS, page 1-6. IEEE Computer Society, (2013)A novel hybrid method for SDD pattern grading and selection., , , , and . VTS, page 45-50. IEEE Computer Society, (2010)Board-level fault diagnosis using Bayesian inference., , , and . VTS, page 244-249. IEEE Computer Society, (2010)Compact Dictionaries for Fault Diagnosis in BIST., and . ISQED, page 105-110. IEEE Computer Society, (2003)Software-based test and diagnosis of SoCs using embedded and wide-I/O DRAM., and . ASP-DAC, page 532-537. IEEE, (2015)Test generation for clock-domain crossing faults in integrated circuits., , , and . DATE, page 406-411. IEEE, (2012)Waste-aware dilution and mixing of biochemical samples with digital microfluidic biochips., , and . DATE, page 1059-1064. IEEE, (2011)Efficient Wrapper/TAM Co-Optimization for Large SOCs., , and . DATE, page 491-498. IEEE Computer Society, (2002)An Interval-Based Diagnosis Scheme for Identifying Failing Vectors in a Scan-BIST Environment., , and . DATE, page 382-386. IEEE Computer Society, (2002)