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At-Speed Interconnect Test and Diagnosis of External Memories on a System., , , and . ITC, page 156-162. IEEE Computer Society, (2004)Realizing High Test Quality Goals with Smart Test Resource Usage., , , , , , , and . ITC, page 525-533. IEEE Computer Society, (2004)An effort-minimized logic BIST implementation method., , , , and . ITC, page 1002-1010. IEEE Computer Society, (2001)Board-Level Functional Fault Diagnosis Using Learning Based on Incremental Support-Vector Machines., , , and . Asian Test Symposium, page 208-213. IEEE Computer Society, (2012)Adaptive Board-Level Functional Fault Diagnosis Using Decision Trees., , , and . Asian Test Symposium, page 202-207. IEEE Computer Society, (2012)Failure prediction based on anomaly detection for complex core routers., , , and . ICCAD, page 49. ACM, (2018)Black-Box Test-Coverage Analysis and Test-Cost Reduction Based on a Bayesian Network Model., , , , and . VTS, page 1-6. IEEE, (2019)Fine-Grained Adaptive Testing Based on Quality Prediction., , , , , and . ITC, page 1-10. IEEE, (2018)Special session 8B - Panel: In-field testing of SoC devices: Which solutions by which players?, , , , , , and . VTS, page 1-2. IEEE Computer Society, (2014)Smart diagnosis: Efficient board-level diagnosis and repair using artificial neural networks., , , , and . ITC, page 1-9. IEEE Computer Society, (2011)