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Raman-Ramsey Interaction for Coherent Population Trapping Cs Clock.

, , , , , , and . IEEE Trans. Instrumentation and Measurement, 56 (2): 383-387 (2007)

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Raman-Ramsey Interaction for Coherent Population Trapping Cs Clock., , , , , , and . IEEE Trans. Instrumentation and Measurement, 56 (2): 383-387 (2007)Observation of Raman-Ramsey fringes with optical CPT pulses., , , , , , and . IEEE Trans. Instrumentation and Measurement, 54 (2): 776-779 (2005)Extraction of defect density and size distributions from wafer sort test results., , , , , , and . DATE, page 913-918. European Design and Automation Association, Leuven, Belgium, (2006)Extracting Defect Density and Size Distributions from Product ICs., , , , , , , and . IEEE Design & Test of Computers, 23 (5): 390-400 (2006)STDF Memory Fail Datalog Standard., , , , , , , , , and . VTS, page 209-214. IEEE Computer Society, (2009)Benchmarking Diagnosis Algorithms With a Diverse Set of IC Deformations., , , , , , , , , and 3 other author(s). ITC, page 508-517. IEEE Computer Society, (2004)Deformations of IC Structure in Test and Yield Learning., , , , , and . ITC, page 856-865. IEEE Computer Society, (2003)