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Disambiguation of "Gattiker, Anne E."

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Deformations of IC Structure in Test and Yield Learning.

, , , , , and . ITC, page 856-865. IEEE Computer Society, (2003)

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E. Garrelts

Anne Zerfass University of Stuttgart

E. Zafeiriou

Anne Beyer University of Stuttgart

Anne Preuschoff University of Stuttgart

 

Other publications of authors with the same name

Power Supply Transient Signal Analysis Under Real Process and Test Hardware Models., , and . VTS, page 357-366. IEEE Computer Society, (2002)Deformations of IC Structure in Test and Yield Learning., , , , , and . ITC, page 856-865. IEEE Computer Society, (2003)Detecting delay faults using power supply transient signal analysis., , , , and . ITC, page 395-404. IEEE Computer Society, (2001)Smart-Substrate Multichip-Module Systems., , , , , and . IEEE Design & Test of Computers, 11 (2): 64-73 (1994)Getting More out of ITC.. IEEE Design & Test of Computers, 23 (5): 432 (2006)Guest Editors' Introduction: Yield Learning Processes and Methods., and . IEEE Design & Test of Computers, 29 (1): 6-7 (2012)Using well/substrate bias manipulation to enhance voltage-test-based defect detection., and . ITC, page 1-6. IEEE Computer Society, (2011)High-performance CMOS variability in the 65-nm regime and beyond., , , , , , , , and . IBM Journal of Research and Development, 50 (4-5): 433-450 (2006)To DFT or Not to DFT?, , , , and . ITC, page 557-566. IEEE Computer Society, (1997)IC failure mechanisms yesterday, today, tomorrow: implications from test to DFM.. ISPD, page 47. ACM, (2006)