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Prospects for WSI: A Manufacturing Perspective.. IEEE Computer, 25 (4): 58-65 (1992)Modeling the Difficulty of Sequential Automatic Test Pattern Generation., and . ICCD, page 261-271. IEEE Computer Society, (1996)Failure Analysis of High-Density CMOS SRAMs: Using Realistic Defect Modeling and I/Sub DDQ/ Testing., , and . IEEE Design & Test of Computers, 10 (2): 13-23 (1993)Fault Tuples in Diagnosis of Deep-Submicron Circuits., , , , , and . ITC, page 233-241. IEEE Computer Society, (2002)Systematic Characterization of Physical Defects for Fault Analysis of MOS IC Cells., , and . ITC, page 390-399. IEEE Computer Society, (1984)To DFT or Not to DFT?, , , , and . ITC, page 557-566. IEEE Computer Society, (1997)Improved Yield Model for Submicron Domain., and . DFT, page 2-10. IEEE Computer Society, (1997)Statistical Simulation of the IC Manufacturing Process., and . IEEE Trans. on CAD of Integrated Circuits and Systems, 1 (3): 120-131 (1982)On Test Set Preservation of Retimed Circuits., , , and . DAC, page 176-182. ACM Press, (1995)2.5D system integration: a design driven system implementation schema., and . ASP-DAC, page 450-455. IEEE Computer Society, (2004)