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Automated Testability Enhancements for Logic Brick Libraries., , , and . DATE, page 480-485. ACM, (2008)Exploiting Regularity for Inductive Fault Analysis., and . VTS, page 364-369. IEEE Computer Society, (2006)Benchmarking Diagnosis Algorithms With a Diverse Set of IC Deformations., , , , , , , , , and 3 other author(s). ITC, page 508-517. IEEE Computer Society, (2004)Extraction of defect density and size distributions from wafer sort test results., , , , , , and . DATE, page 913-918. European Design and Automation Association, Leuven, Belgium, (2006)Multiple-detect ATPG based on physical neighborhoods., , , and . DAC, page 1099-1102. ACM, (2006)Extracting Defect Density and Size Distributions from Product ICs., , , , , , , and . IEEE Design & Test of Computers, 23 (5): 390-400 (2006)A Built-in Self-test and Diagnosis Strategy for Chemically Assembled Electronic Nanotechnology., and . J. Electronic Testing, 23 (2-3): 131-144 (2007)CAEN-BIST: Testing the NanoFabric., and . ITC, page 462-471. IEEE Computer Society, (2004)Automated Standard Cell Library Analysis for Improved Defect Modeling., and . ISQED, page 643-648. IEEE Computer Society, (2008)