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Disambiguation of "Maly, Wojciech"

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Extraction of defect density and size distributions from wafer sort test results.

, , , , , , and . DATE, page 913-918. European Design and Automation Association, Leuven, Belgium, (2006)

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Other publications of authors with the same name

Improved Yield Model for Submicron Domain., and . DFT, page 2-10. IEEE Computer Society, (1997)Statistical Simulation of the IC Manufacturing Process., and . IEEE Trans. on CAD of Integrated Circuits and Systems, 1 (3): 120-131 (1982)Prospects for WSI: A Manufacturing Perspective.. IEEE Computer, 25 (4): 58-65 (1992)Failure Analysis of High-Density CMOS SRAMs: Using Realistic Defect Modeling and I/Sub DDQ/ Testing., , and . IEEE Design & Test of Computers, 10 (2): 13-23 (1993)Modeling the Difficulty of Sequential Automatic Test Pattern Generation., and . ICCD, page 261-271. IEEE Computer Society, (1996)To DFT or Not to DFT?, , , , and . ITC, page 557-566. IEEE Computer Society, (1997)Fault Tuples in Diagnosis of Deep-Submicron Circuits., , , , , and . ITC, page 233-241. IEEE Computer Society, (2002)Systematic Characterization of Physical Defects for Fault Analysis of MOS IC Cells., , and . ITC, page 390-399. IEEE Computer Society, (1984)2.5D system integration: a design driven system implementation schema., and . ASP-DAC, page 450-455. IEEE Computer Society, (2004)Interconnect yield model for manufacturability prediction in synthesis of standard cell based designs., and . ICCAD, page 368-373. IEEE Computer Society / ACM, (1996)