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Extraction of defect density and size distributions from wafer sort test results.

J. Nelson, T. Zanon, R. Desineni, J. Brown, N. Patil, W. Maly, and R. Blanton. DATE, page 913-918. European Design and Automation Association, Leuven, Belgium, (2006)

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G. Daiß

G. Wagner

Dr. phil. Niklas Brown University of Stuttgart

Jason Kennedy Appelbaum University of Stuttgart

Dr. Guido Reina University of Stuttgart

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Benchmarking Diagnosis Algorithms With a Diverse Set of IC Deformations.T. Vogels, T. Zanon, R. Desineni, R. Blanton, W. Maly, J. Brown, J. Nelson, Y. Fei, X. Huang, P. Gopalakrishnan and 3 other author(s). ITC, page 508-517. IEEE Computer Society, (2004)Exploiting Regularity for Inductive Fault Analysis.J. Brown, and R. Blanton. VTS, page 364-369. IEEE Computer Society, (2006)Automated Testability Enhancements for Logic Brick Libraries.J. Brown, B. Taylor, R. Blanton, and L. Pileggi. DATE, page 480-485. ACM, (2008)Extraction of defect density and size distributions from wafer sort test results.J. Nelson, T. Zanon, R. Desineni, J. Brown, N. Patil, W. Maly, and R. Blanton. DATE, page 913-918. European Design and Automation Association, Leuven, Belgium, (2006)Extracting Defect Density and Size Distributions from Product ICs.J. Nelson, T. Zanon, J. Brown, O. Poku, R. Blanton, W. Maly, B. Benware, and C. Schuermyer. IEEE Design & Test of Computers, 23 (5): 390-400 (2006)Multiple-detect ATPG based on physical neighborhoods.J. Nelson, J. Brown, R. Desineni, and R. Blanton. DAC, page 1099-1102. ACM, (2006)A Built-in Self-test and Diagnosis Strategy for Chemically Assembled Electronic Nanotechnology.J. Brown, and R. Blanton. J. Electronic Testing, 23 (2-3): 131-144 (2007)Automated Standard Cell Library Analysis for Improved Defect Modeling.J. Brown, and R. Blanton. ISQED, page 643-648. IEEE Computer Society, (2008)CAEN-BIST: Testing the NanoFabric.J. Brown, and R. Blanton. ITC, page 462-471. IEEE Computer Society, (2004)