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%0 Conference Paper
%1 conf/itc/MalyGZVBS03
%A Maly, Wojciech
%A Gattiker, Anne E.
%A Zanon, Thomas
%A Vogels, Thomas J.
%A Blanton, R. D. (Shawn)
%A Storey, Thomas M.
%B ITC
%D 2003
%I IEEE Computer Society
%K dblp
%P 856-865
%T Deformations of IC Structure in Test and Yield Learning.
%U http://dblp.uni-trier.de/db/conf/itc/itc2003.html#MalyGZVBS03
%@ 0-7803-8106-8
@inproceedings{conf/itc/MalyGZVBS03,
added-at = {2015-08-26T00:00:00.000+0200},
author = {Maly, Wojciech and Gattiker, Anne E. and Zanon, Thomas and Vogels, Thomas J. and Blanton, R. D. (Shawn) and Storey, Thomas M.},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/28ebbe255256464e088655b1064a8b7ff/dblp},
booktitle = {ITC},
crossref = {conf/itc/2003},
ee = {http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1271071},
interhash = {fe3952a4681f0394ad49ba5166c1afc9},
intrahash = {8ebbe255256464e088655b1064a8b7ff},
isbn = {0-7803-8106-8},
keywords = {dblp},
pages = {856-865},
publisher = {IEEE Computer Society},
timestamp = {2016-02-02T15:31:49.000+0100},
title = {Deformations of IC Structure in Test and Yield Learning.},
url = {http://dblp.uni-trier.de/db/conf/itc/itc2003.html#MalyGZVBS03},
year = 2003
}