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Disambiguation of "Wunderlich, Hans-Joachim"

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Test exploration and validation using transaction level models.

, , , , , , , and . DATE, page 1250-1253. IEEE, (2009)

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Prof. Dr. Hans-Joachim Wunderlich University of Stuttgart

Hans-Joachim Bungartz

Hans-Joachim Bieg

Hans-Joachim Gehrmann University of Stuttgart

Univ. -Prof. Hans-Joachim Petsch University of Stuttgart

 

Other publications of authors with the same name

A Refined Electrical Model for Particle Strikes and its Impact on SEU Prediction., , , , , and . DFT, page 50-58. IEEE Computer Society, (2007)A Mixed-Mode BIST Scheme Based on Folding Compression., , and . J. Comput. Sci. Technol., 17 (2): 203-212 (2002)Using mission logic for embedded testing., and . DATE, page 805. IEEE Computer Society, (2001)Deterministic Pattern Generation for Weighted Random Pattern Testing., and . ED&TC, page 30-36. IEEE Computer Society, (1996)Reuse of Structural Volume Test Methods for In-System Testing of Automotive ASICs., , , , , and . Asian Test Symposium, page 214-219. IEEE Computer Society, (2012)Embedded Test for Highly Accurate Defect Localization., , , and . Asian Test Symposium, page 213-218. IEEE Computer Society, (2011)Accurate Multi-cycle ATPG in Presence of X-Values., , , , and . Asian Test Symposium, page 245-250. IEEE Computer Society, (2013)Tools and devices supporting the pseudo-exhaustive test., and . EURO-DAC, page 13-17. IEEE Computer Society, (1990)Concurrent Self-Test with Partially Specified Patterns for Low Test Latency and Overhead., , and . European Test Symposium, page 53-58. IEEE Computer Society, (2009)Towards Variation-Aware Test Methods., , , , and . European Test Symposium, page 219-225. IEEE Computer Society, (2011)