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Disambiguation of "Wunderlich, Hans-Joachim"

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Transparent Structural Online Test for Reconfigurable Systems

, , , , , , , and . Proceedings of the 18th IEEE International On-Line Testing Symposium (IOLTS'12), page 37--42. IEEE Computer Society, (2012)
DOI: http://dx.doi.org/10.1109/IOLTS.2012.6313838

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Prof. Dr. Hans-Joachim Wunderlich University of Stuttgart

Hans-Joachim Bungartz

Hans-Joachim Bieg

Hans-Joachim Gehrmann University of Stuttgart

Univ. -Prof. Hans-Joachim Petsch University of Stuttgart

 

Other publications of authors with the same name

A Mixed-Mode BIST Scheme Based on Folding Compression., , and . J. Comput. Sci. Technol., 17 (2): 203-212 (2002)Deterministic logic BIST for transition fault testing., , , and . IET Computers & Digital Techniques, 1 (3): 180-186 (2007)Accurate Multi-cycle ATPG in Presence of X-Values., , , , and . Asian Test Symposium, page 245-250. IEEE Computer Society, (2013)Reuse of Structural Volume Test Methods for In-System Testing of Automotive ASICs., , , , , and . Asian Test Symposium, page 214-219. IEEE Computer Society, (2012)Embedded Test for Highly Accurate Defect Localization., , , and . Asian Test Symposium, page 213-218. IEEE Computer Society, (2011)Using mission logic for embedded testing., and . DATE, page 805. IEEE Computer Society, (2001)Deterministic Pattern Generation for Weighted Random Pattern Testing., and . ED&TC, page 30-36. IEEE Computer Society, (1996)Adaptive Bayesian Diagnosis of Intermittent Faults., , , , and . J. Electronic Testing, 30 (5): 527-540 (2014)Deterministic BIST with Partial Scan., and . J. Electronic Testing, 16 (3): 169-177 (2000)An analytical approach to the partial scan problem., and . J. Electronic Testing, 1 (2): 163-174 (1990)