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Disambiguation of "Meterelliyoz, Mesut"

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Statistical yield analysis of silicon-on-insulator embedded DRAM.

, , , , , , , and . ISQED, page 190-194. IEEE Computer Society, (2009)

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Other publications of authors with the same name

A high sensitivity process variation sensor utilizing sub-threshold operation., , , , and . CICC, page 125-128. IEEE, (2008)A leakage control system for thermal stability during burn-in test., , and . ITC, page 10. IEEE Computer Society, (2005)Self-Consistent Approach to Leakage Power and Temperature Estimation to Predict Thermal Runaway in FinFET Circuits., , , , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 26 (11): 2059-2068 (2007)Integrated Design & Test: Conquering the Conflicting Requirements of Low-Power, Variation-Tolerance and Test Cost., , , , and . Asian Test Symposium, page 486-491. IEEE Computer Society, (2011)Analysis of SRAM and eDRAM Cache Memories Under Spatial Temperature Variations., , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 29 (1): 2-13 (2010)A 3.6Mb 10.1Mb/mm2 Embedded Non-Volatile ReRAM Macro in 22nm FinFET Technology with Adaptive Forming/Set/Reset Schemes Yielding Down to 0.5V with Sensing Time of 5ns at 0.7V., , , , , , , , , and 7 other author(s). ISSCC, page 212-214. IEEE, (2019)Thermal analysis of 8-T SRAM for nano-scaled technologies., , and . ISLPED, page 123-128. ACM, (2008)Rethinking Refresh: Increasing Availability and Reducing Power in DRAM for Cache Applications., , and . IEEE Micro, 28 (6): 47-56 (2008)Statistical yield analysis of silicon-on-insulator embedded DRAM., , , , , , , and . ISQED, page 190-194. IEEE Computer Society, (2009)Characterization of Random Process Variations Using Ultralow-Power, High-Sensitivity, Bias-Free Sub-Threshold Process Sensor., , , , and . IEEE Trans. on Circuits and Systems, 57-I (8): 1838-1847 (2010)