%0 Journal Article %1 journals/tcad/ChoiBMMR07 %A Choi, Jung Hwan %A Bansal, Aditya %A Meterelliyoz, Mesut %A Murthy, Jayathi %A Roy, Kaushik %D 2007 %J IEEE Trans. on CAD of Integrated Circuits and Systems %K dblp %N 11 %P 2059-2068 %T Self-Consistent Approach to Leakage Power and Temperature Estimation to Predict Thermal Runaway in FinFET Circuits. %U http://dblp.uni-trier.de/db/journals/tcad/tcad26.html#ChoiBMMR07 %V 26

@article{journals/tcad/ChoiBMMR07, added-at = {2008-04-08T00:00:00.000+0200}, author = {Choi, Jung Hwan and Bansal, Aditya and Meterelliyoz, Mesut and Murthy, Jayathi and Roy, Kaushik}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/23e3c1842f81e27a37fb25c393c3d06c4/dblp}, ee = {http://dx.doi.org/10.1109/TCAD.2007.906470}, interhash = {20f3d4929314bcd9236cbcd5d405d07d}, intrahash = {3e3c1842f81e27a37fb25c393c3d06c4}, journal = {IEEE Trans. on CAD of Integrated Circuits and Systems}, keywords = {dblp}, number = 11, pages = {2059-2068}, timestamp = {2016-07-28T09:33:29.000+0200}, title = {Self-Consistent Approach to Leakage Power and Temperature Estimation to Predict Thermal Runaway in FinFET Circuits.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad26.html#ChoiBMMR07}, volume = 26, year = 2007 }