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Self-Consistent Approach to Leakage Power and Temperature Estimation to Predict Thermal Runaway in FinFET Circuits.

J. Choi, A. Bansal, M. Meterelliyoz, J. Murthy, and K. Roy. IEEE Trans. on CAD of Integrated Circuits and Systems, 26 (11): 2059-2068 (2007)

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A coupled ordinates method for solution acceleration of rarefied gas dynamics simulations.S. Das, S. Mathur, A. Alexeenko, and J. Murthy. J. Comput. Physics, (2015)Self-Consistent Approach to Leakage Power and Temperature Estimation to Predict Thermal Runaway in FinFET Circuits.J. Choi, A. Bansal, M. Meterelliyoz, J. Murthy, and K. Roy. IEEE Trans. on CAD of Integrated Circuits and Systems, 26 (11): 2059-2068 (2007)A Highly Scalable Simulation Model for Atomistic Calculation of Thermal Properties of Silicon.L. Sun, C. Le, F. Saied, and J. Murthy. PDPTA, page 306-312. CSREA Press, (2006)The effect of process variation on device temperature in FinFET circuits.J. Choi, J. Murthy, and K. Roy. ICCAD, page 747-751. IEEE Computer Society, (2007)PUQ: A code for non-intrusive uncertainty propagation in computer simulations.M. Hunt, B. Haley, M. McLennan, M. Koslowski, J. Murthy, and A. Strachan. Comput. Phys. Commun., (2015)Compact thermal models for estimation of temperature-dependent power/performance in FinFET technology.A. Bansal, M. Meterelliyoz, S. Singh, J. Choi, J. Murthy, and K. Roy. ASP-DAC, page 237-242. IEEE, (2006)Leakage power dependent temperature estimation to predict thermal runaway in FinFET circuits.J. Choi, A. Bansal, M. Meterelliyoz, J. Murthy, and K. Roy. ICCAD, page 583-586. ACM, (2006)Macroelectronics: Perspectives on Technology and Applications.R. Reuss, B. Chalamala, A. Moussessian, M. Kane, A. Kumar, D. Zhang, J. Rogers, M. Hatalis, D. Temple, G. Moddel and 14 other author(s). Proceedings of the IEEE, 93 (7): 1239-1256 (2005)

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Self-Consistent Approach to Leakage Power and Temperature Estimation to Predict Thermal Runaway in FinFET Circuits.

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copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Self-Consistent Approach to Leakage Power and Temperature Estimation to Predict Thermal Runaway in FinFET Circuits.

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Self-Consistent Approach to Leakage Power and Temperature Estimation to Predict Thermal Runaway in FinFET Circuits.