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%0 Journal Article
%1 journals/tcas/MeterelliyozSSKR10
%A Meterelliyoz, Mesut
%A Song, Peilin
%A Stellari, Franco
%A Kulkarni, Jaydeep P.
%A Roy, Kaushik
%D 2010
%J IEEE Trans. on Circuits and Systems
%K dblp
%N 8
%P 1838-1847
%T Characterization of Random Process Variations Using Ultralow-Power, High-Sensitivity, Bias-Free Sub-Threshold Process Sensor.
%U http://dblp.uni-trier.de/db/journals/tcas/tcasI57.html#MeterelliyozSSKR10
%V 57-I
@article{journals/tcas/MeterelliyozSSKR10,
added-at = {2011-10-19T00:00:00.000+0200},
author = {Meterelliyoz, Mesut and Song, Peilin and Stellari, Franco and Kulkarni, Jaydeep P. and Roy, Kaushik},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/29bb3e4a7e25f56e9e5a6272445f875fd/dblp},
ee = {http://dx.doi.org/10.1109/TCSI.2009.2037449},
interhash = {1988c29a0568748935824182d34c1319},
intrahash = {9bb3e4a7e25f56e9e5a6272445f875fd},
journal = {IEEE Trans. on Circuits and Systems},
keywords = {dblp},
number = 8,
pages = {1838-1847},
timestamp = {2016-07-28T09:32:41.000+0200},
title = {Characterization of Random Process Variations Using Ultralow-Power, High-Sensitivity, Bias-Free Sub-Threshold Process Sensor.},
url = {http://dblp.uni-trier.de/db/journals/tcas/tcasI57.html#MeterelliyozSSKR10},
volume = {57-I},
year = 2010
}
