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Impact of Passive & Active Load Gate Impedance on Breakdown Hardness in 28nm FDSOI Technology., , , , , , and . IRPS, page 1-5. IEEE, (2019)Performance & reliability of 3D architectures (πfet, Finfet, Ωfet)., , , , , , , , , and . IRPS, page 6. IEEE, (2018)From XML to RDF: Syntax, Semantics, Security, and Integrity (Invited Paper)., , , and . IICIS, volume 193 of IFIP, page 41-55. Springer, (2004)Gene Identification: Classical and Computational Intelligence Approaches., , and . IEEE Trans. Systems, Man, and Cybernetics, Part C, 38 (1): 55-68 (2008)Characterization and Modelling of High Speed Ge Photodetectors Reliability., , , , , , , , and . IRPS, page 1-5. IEEE, (2019)Visibility Graph-Based Spatial Path Planning of Robots Using Configuration Space Algorithms.. I. J. Robotics and Automation, (2009)A GA based penalty function technique for solving constrained redundancy allocation problem of series system with interval valued reliability of components., , and . J. Computational Applied Mathematics, 232 (2): 275-284 (2009)Process Optimization for HCI Improvement in I/O Analog Devices., , , , , , , and . IRPS, page 1-6. IEEE, (2019)The IBM Zurich Research Laboratory's 1.13 Gb/s LAN/MAN Prototype., , , , , , , and . Computer Networks and ISDN Systems, 26 (2): 163-183 (1993)Next generation backplane and copper cable challenges., , , , and . IEEE Communications Magazine, 51 (12): 130-136 (2013)