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Path-RO: a novel on-chip critical path delay measurement under process variations.

, , and . ICCAD, page 640-646. IEEE Computer Society, (2008)

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Low-Transition Test Pattern Generation for BIST-Based Applications., , and . IEEE Trans. Computers, 57 (3): 303-315 (2008)BISA: Built-in self-authentication for preventing hardware Trojan insertion., and . HOST, page 45-50. IEEE Computer Society, (2013)Sensitivity Analysis to Hardware Trojans using Power Supply Transient Signals., , and . HOST, page 3-7. IEEE Computer Society, (2008)Hardware Trojan Detection and Isolation Using Current Integration and Localized Current Analysis., , , and . DFT, page 87-95. IEEE Computer Society, (2008)Test and Diagnosis for Small-Delay Defects., , and . Springer, (2011)Test-Pattern Selection for Screening Small-Delay Defects in Very-Deep Submicrometer Integrated Circuits., , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 29 (5): 760-773 (2010)Counterfeit Integrated Circuits: A Rising Threat in the Global Semiconductor Supply Chain., , , , , and . Proceedings of the IEEE, 102 (8): 1207-1228 (2014)Test-Pattern Grading and Pattern Selection for Small-Delay Defects., , and . VTS, page 233-239. IEEE Computer Society, (2008)Pattern Generation and Estimation for Power Supply Noise Analysis., , and . VTS, page 439-444. IEEE Computer Society, (2005)Session Abstract., and . VTS, page 292-293. IEEE Computer Society, (2006)