PUMA

academical publication management
collect, organize, and share publications

( en | de )

 

Disambiguation of "Tehranipoor, Mohammad"

Author of the publication

copydeleteadd this publication to your clipboard
Path-RO: a novel on-chip critical path delay measurement under process variations.

, , and . ICCAD, page 640-646. IEEE Computer Society, (2008)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Mohammad Ebrahimi University of Stuttgart

Mohammad Kasra Habib University of Stuttgart

Dorsa Mohammad Zaheri University of Stuttgart

Mohammad Youssef Mahfouz University of Stuttgart

Seyedeh Bina Mohammad Hejazi University of Stuttgart

 

Other publications of authors with the same name

Radic: A standard-cell-based sensor for on-chip aging and flip-flop metastability measurements., , , , , , , and . ITC, page 1-9. IEEE Computer Society, (2012)Low-Transition Test Pattern Generation for BIST-Based Applications., , and . IEEE Trans. Computers, 57 (3): 303-315 (2008)Nine-coded compression technique for testing embedded cores in SoCs., , and . IEEE Trans. VLSI Syst., 13 (6): 719-731 (2005)Securing Designs against Scan-Based Side-Channel Attacks., , , and . IEEE Trans. Dependable Sec. Comput., 4 (4): 325-336 (2007)Guest Editors' Introduction: IR Drop in Very Deep-Submicron Designs., and . IEEE Design & Test of Computers, 24 (3): 214-215 (2007)A novel method for fast identification of peak current during test., , , , , and . VTS, page 191-196. IEEE Computer Society, (2012)Counterfeit Integrated Circuits: A Rising Threat in the Global Semiconductor Supply Chain., , , , , and . Proceedings of the IEEE, 102 (8): 1207-1228 (2014)Test-Pattern Selection for Screening Small-Delay Defects in Very-Deep Submicrometer Integrated Circuits., , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 29 (5): 760-773 (2010)BISA: Built-in self-authentication for preventing hardware Trojan insertion., and . HOST, page 45-50. IEEE Computer Society, (2013)Sensitivity Analysis to Hardware Trojans using Power Supply Transient Signals., , and . HOST, page 3-7. IEEE Computer Society, (2008)