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Disambiguation of "Ferriss, Mark A."

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A 23.5 GHz PLL With an Adaptively Biased VCO in 32 nm SOI-CMOS.

, , , , , , , , , , , , , , and . IEEE Trans. on Circuits and Systems, 60-I (8): 2009-2017 (2013)

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A. Laukemann

Mark Burkhardt University of Stuttgart

Dr. Mark Hamilton University of Stuttgart

Mark Kurcsics University of Stuttgart

Dr. rer. nat. habil. Frederik Marks University of Stuttgart

 

Other publications of authors with the same name

A 14 mW Fractional-N PLL Modulator With a Digital Phase Detector and Frequency Switching Scheme., and . J. Solid-State Circuits, 43 (11): 2464-2471 (2008)A 23.5 GHz PLL With an Adaptively Biased VCO in 32 nm SOI-CMOS., , , , , , , , , and 5 other author(s). IEEE Trans. on Circuits and Systems, 60-I (8): 2009-2017 (2013)A 52 GHz Frequency Synthesizer Featuring a 2nd Harmonic Extraction Technique That Preserves VCO Performance., , and . J. Solid-State Circuits, 50 (5): 1214-1223 (2015)A 28-GHz 32-Element TRX Phased-Array IC With Concurrent Dual-Polarized Operation and Orthogonal Phase and Gain Control for 5G Communications., , , , , , , , , and 12 other author(s). J. Solid-State Circuits, 52 (12): 3373-3391 (2017)Indirect performance sensing for on-chip analog self-healing via Bayesian model fusion., , , , , , , , , and 4 other author(s). CICC, page 1-4. IEEE, (2013)10.8 A 12-to-26GHz fractional-N PLL with dual continuous tuning LC-D/VCOs., , , , and . ISSCC, page 196-198. IEEE, (2016)Indirect phase noise sensing for self-healing voltage controlled oscillators., , , , , , and . CICC, page 1-4. IEEE, (2011)An Integral Path Self-Calibration Scheme for a Dual-Loop PLL., , , , , , , , , and 1 other author(s). J. Solid-State Circuits, 48 (4): 996-1008 (2013)Indirect Performance Sensing for On-Chip Self-Healing of Analog and RF Circuits., , , , , , , , , and 4 other author(s). IEEE Trans. on Circuits and Systems, 61-I (8): 2243-2252 (2014)An integral path self-calibration scheme for a 20.1-26.7GHz dual-loop PLL in 32nm SOI CMOS., , , , , , , , , and 1 other author(s). VLSIC, page 176-177. IEEE, (2012)