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Disambiguation of "Sun, Shupeng"

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Indirect Performance Sensing for On-Chip Self-Healing of Analog and RF Circuits.

, , , , , , , , , , , , , and . IEEE Trans. on Circuits and Systems, 61-I (8): 2243-2252 (2014)

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Dr. Kaicong Sun University of Stuttgart

Jun. -Prof. Sun Hea Hong University of Stuttgart

 

Other publications of authors with the same name

Fast statistical analysis of rare circuit failure events via scaled-sigma sampling for high-dimensional variation space., , , , and . ICCAD, page 478-485. IEEE, (2013)Structure-aware high-dimensional performance modeling for analog and mixed-signal circuits., , and . CICC, page 1-4. IEEE, (2013)Efficient SRAM Failure Rate Prediction via Gibbs Sampling., , , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 31 (12): 1831-1844 (2012)Fast statistical analysis of rare failure events for memory circuits in high-dimensional variation space., and . ASP-DAC, page 302-307. IEEE, (2015)Bayesian model fusion: a statistical framework for efficient pre-silicon validation and post-silicon tuning of complex analog and mixed-signal circuits., , , and . ICCAD, page 795-802. IEEE, (2013)Indirect Performance Sensing for On-Chip Self-Healing of Analog and RF Circuits., , , , , , , , , and 4 other author(s). IEEE Trans. on Circuits and Systems, 61-I (8): 2243-2252 (2014)Fast statistical analysis of rare circuit failure events via subset simulation in high-dimensional variation space., and . ICCAD, page 324-331. IEEE, (2014)Fast Statistical Analysis of Rare Circuit Failure Events via Scaled-Sigma Sampling for High-Dimensional Variation Space., , , , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 34 (7): 1096-1109 (2015)Fast statistical analysis of rare circuit failure events via Bayesian scaled-sigma sampling for high-dimensional variation space., and . CICC, page 1-4. IEEE, (2015)Efficient parametric yield estimation of analog/mixed-signal circuits via Bayesian model fusion., , , , and . ICCAD, page 627-634. ACM, (2012)